Adaptive, symmetry-informed Bayesian metrology for precise quantum technology measurements

Fuente: arXiv
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Autori principali: Overton, Matt, Rubio, Jesús, Cooper, Nathan, Baldolini, Daniele, Johnson, David, Anders, Janet, Hackermüller, Lucia
Natura: Preprint
Pubblicazione: 2024
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author Overton, Matt
Rubio, Jesús
Cooper, Nathan
Baldolini, Daniele
Johnson, David
Anders, Janet
Hackermüller, Lucia
author_facet Overton, Matt
Rubio, Jesús
Cooper, Nathan
Baldolini, Daniele
Johnson, David
Anders, Janet
Hackermüller, Lucia
contents High precision measurements are essential to solve major scientific and technological challenges, from gravitational wave detection to healthcare diagnostics. Quantum sensing delivers greater precision, but an in-depth optimisation of measurement procedures has been overlooked. Here we present a systematic strategy for parameter estimation in the low-data limit that integrates experimental control parameters and natural symmetries. The method is guided by a Bayesian quantifier of precision gain, enabling adaptive optimisation tailored to the experiment. We provide general expressions for optimal estimators for any parameter. The strategy's power is demonstrated in a quantum technology experiment, in which ultracold caesium atoms are confined in a micromachined hole in an optical fibre. We find a five-fold reduction in the fractional variance of the estimated parameter, compared to the standard measurement procedure. Equivalently, our strategy achieves a target precision with a third of the data points previously required. Such enhanced device performance and accelerated data collection will be essential for applications in quantum computing, communication, metrology, and the wider quantum technology sector.
format Preprint
id arxiv_https___arxiv_org_abs_2410_10615
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Adaptive, symmetry-informed Bayesian metrology for precise quantum technology measurements
Overton, Matt
Rubio, Jesús
Cooper, Nathan
Baldolini, Daniele
Johnson, David
Anders, Janet
Hackermüller, Lucia
Quantum Physics
Atomic Physics
Data Analysis, Statistics and Probability
High precision measurements are essential to solve major scientific and technological challenges, from gravitational wave detection to healthcare diagnostics. Quantum sensing delivers greater precision, but an in-depth optimisation of measurement procedures has been overlooked. Here we present a systematic strategy for parameter estimation in the low-data limit that integrates experimental control parameters and natural symmetries. The method is guided by a Bayesian quantifier of precision gain, enabling adaptive optimisation tailored to the experiment. We provide general expressions for optimal estimators for any parameter. The strategy's power is demonstrated in a quantum technology experiment, in which ultracold caesium atoms are confined in a micromachined hole in an optical fibre. We find a five-fold reduction in the fractional variance of the estimated parameter, compared to the standard measurement procedure. Equivalently, our strategy achieves a target precision with a third of the data points previously required. Such enhanced device performance and accelerated data collection will be essential for applications in quantum computing, communication, metrology, and the wider quantum technology sector.
title Adaptive, symmetry-informed Bayesian metrology for precise quantum technology measurements
topic Quantum Physics
Atomic Physics
Data Analysis, Statistics and Probability
url https://arxiv.org/abs/2410.10615