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Mechanism of $E'_γ$ Defect Generation in Ionizing-irradiated $a$-SiO$_2$: The Nonradiative Carrier Capture-Structural Relaxation Model

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Song, Yu, Qiu, Chen, Wei, Su-Huai
Formato:	Preprint
Publicado:	2024
Materias:	Materials Science Applied Physics
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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