Study of delamination in REBCO coated conductor by transmission electron microscopy
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arXiv
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| Main Authors: | , , |
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| Format: | Preprint |
| Published: |
2024
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| _version_ | 1866913547480465408 |
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| author | Xin, Yan Lu, Jun Han, Ke |
| author_facet | Xin, Yan Lu, Jun Han, Ke |
| contents | Delamination strength of REBCO is very important for its applications in large magnet projects. This work presented the transmission electron microscopy (TEM) investigation of the microstructures of the REBCO coated conductor to understand its delamination property. We found that the low delamination strength is associated with nano-voids formed at the IBAD MgO/Y2O3 interface. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2410_11556 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Study of delamination in REBCO coated conductor by transmission electron microscopy Xin, Yan Lu, Jun Han, Ke Superconductivity Delamination strength of REBCO is very important for its applications in large magnet projects. This work presented the transmission electron microscopy (TEM) investigation of the microstructures of the REBCO coated conductor to understand its delamination property. We found that the low delamination strength is associated with nano-voids formed at the IBAD MgO/Y2O3 interface. |
| title | Study of delamination in REBCO coated conductor by transmission electron microscopy |
| topic | Superconductivity |
| url | https://arxiv.org/abs/2410.11556 |