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Integrating Artificial Intelligence Models and Synthetic Image Data for Enhanced Asset Inspection and Defect Identification

Fuente: arXiv
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Bibliographic Details
Main Authors: Mandati, Reddy, Anderson, Vladyslav, Chen, Po-chen, Agarwal, Ankush, Dokic, Tatjana, Barnard, David, Finn, Michael, Cromer, Jesse, Mccauley, Andrew, Tutaj, Clay, Dave, Neha, Besharati, Bobby, Barnett, Jamie, Krall, Timothy
Format: Preprint
Published: 2024
Subjects:
Computer Vision and Pattern Recognition
Machine Learning
Online Access:
Acceder al recurso
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