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| Format: | Preprint |
| Published: |
2024
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| Online Access: | https://arxiv.org/abs/2410.12149 |
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| _version_ | 1866910652308652032 |
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| author | Kondyurin, Alexey |
| author_facet | Kondyurin, Alexey |
| contents | A brush structure is an interesting object for future applications in medical and electronic devices. Usual substrate for the brushes is silicon wafer with linker molecules. In present study an ion beam treatment of polymer was used for attachment of brush structures without liker molecules. The goal of the study was a fabrication of carbonized active substrate and a direct attachment of different brush molecules. The carbonised coating on silicon wafer has been prepared from ion beam implanted polystyrene coating and characterised with AFM, XPS, ESR, Raman, FTIR and ellipsometry measurements. The brush structures based on polystyrene and polyacrylamide backbone with thiol, amine and carboxyl end groups have been synthesised on the carbonised substrates. The brush structures have been characterised with ellipsometry, XPS, FTIR and AFM. The swollen brush shows a thickness phase transition with temperature rise. The attachment of the brush structures is based on free radical reactions on the carbonised surface. The effect of impurity of the brush polymer was found significant. Thus, the brush structures of broad kinds of the end groups can be synthesised on the carbonised substrates without a linker. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2410_12149 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Brush structures directly anchored to ion beam treated polymer surfaces without linker Kondyurin, Alexey Chemical Physics A brush structure is an interesting object for future applications in medical and electronic devices. Usual substrate for the brushes is silicon wafer with linker molecules. In present study an ion beam treatment of polymer was used for attachment of brush structures without liker molecules. The goal of the study was a fabrication of carbonized active substrate and a direct attachment of different brush molecules. The carbonised coating on silicon wafer has been prepared from ion beam implanted polystyrene coating and characterised with AFM, XPS, ESR, Raman, FTIR and ellipsometry measurements. The brush structures based on polystyrene and polyacrylamide backbone with thiol, amine and carboxyl end groups have been synthesised on the carbonised substrates. The brush structures have been characterised with ellipsometry, XPS, FTIR and AFM. The swollen brush shows a thickness phase transition with temperature rise. The attachment of the brush structures is based on free radical reactions on the carbonised surface. The effect of impurity of the brush polymer was found significant. Thus, the brush structures of broad kinds of the end groups can be synthesised on the carbonised substrates without a linker. |
| title | Brush structures directly anchored to ion beam treated polymer surfaces without linker |
| topic | Chemical Physics |
| url | https://arxiv.org/abs/2410.12149 |