You Only Look Twice! for Failure Causes Identification of Drill Bits

Fuente: arXiv

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Bibliographic Details
Main Authors:	Yamani, Asma, Al-Otaiby, Nehal, Al-Shemmeri, Haifa, Boudellioua, Imane
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Computational Engineering, Finance, and Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2410.14282