On the Influence of Parallax Effects in Thick Silicon Sensors in Coherent Diffraction Imaging

Fuente: arXiv

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Bibliographic Details
Main Authors:	Kuster, Markus, Hartmann, Robert, Hauf, Steffen, Holl, Peter, Rüter, Tonn, Strüder, Lothar
Format:	Preprint
Published:	2024
Subjects:	Instrumentation and Detectors Computational Physics
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2410.14474