On the Influence of Parallax Effects in Thick Silicon Sensors in Coherent Diffraction Imaging
Fuente:
arXiv
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| Main Authors: | Kuster, Markus, Hartmann, Robert, Hauf, Steffen, Holl, Peter, Rüter, Tonn, Strüder, Lothar |
|---|---|
| Format: | Preprint |
| Published: |
2024
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| Subjects: | |
| Online Access: | |
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