BEACON -- Automated Aberration Correction for Scanning Transmission Electron Microscopy using Bayesian Optimization

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Pattison, Alexander J., Ribet, Stephanie M., Noack, Marcus M., Varnavides, Georgios, Park, Kunwoo, Kirkland, Earl, Park, Jungwon, Ophus, Colin, Ercius, Peter
Format:	Preprint
Published:	2024
Subjects:	Materials Science Instrumentation and Detectors
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2410.14873