BEACON -- Automated Aberration Correction for Scanning Transmission Electron Microscopy using Bayesian Optimization
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| Main Authors: | , , , , , , , , |
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| Format: | Preprint |
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2024
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| _version_ | 1866916445675323392 |
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| author | Pattison, Alexander J. Ribet, Stephanie M. Noack, Marcus M. Varnavides, Georgios Park, Kunwoo Kirkland, Earl Park, Jungwon Ophus, Colin Ercius, Peter |
| author_facet | Pattison, Alexander J. Ribet, Stephanie M. Noack, Marcus M. Varnavides, Georgios Park, Kunwoo Kirkland, Earl Park, Jungwon Ophus, Colin Ercius, Peter |
| contents | Aberration correction is an important aspect of modern high-resolution scanning transmission electron microscopy. Most methods of aligning aberration correctors require specialized sample regions and are unsuitable for fine-tuning aberrations without interrupting on-going experiments. Here, we present an automated method of correcting first- and second-order aberrations called BEACON which uses Bayesian optimization of the normalized image variance to efficiently determine the optimal corrector settings. We demonstrate its use on gold nanoparticles and a hafnium dioxide thin film showing its versatility in nano- and atomic-scale experiments. BEACON can correct all first- and second-order aberrations simultaneously to achieve an initial alignment and first- and second-order aberrations independently for fine alignment. Ptychographic reconstructions are used to demonstrate an improvement in probe shape and a reduction in the target aberration. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2410_14873 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | BEACON -- Automated Aberration Correction for Scanning Transmission Electron Microscopy using Bayesian Optimization Pattison, Alexander J. Ribet, Stephanie M. Noack, Marcus M. Varnavides, Georgios Park, Kunwoo Kirkland, Earl Park, Jungwon Ophus, Colin Ercius, Peter Materials Science Instrumentation and Detectors Aberration correction is an important aspect of modern high-resolution scanning transmission electron microscopy. Most methods of aligning aberration correctors require specialized sample regions and are unsuitable for fine-tuning aberrations without interrupting on-going experiments. Here, we present an automated method of correcting first- and second-order aberrations called BEACON which uses Bayesian optimization of the normalized image variance to efficiently determine the optimal corrector settings. We demonstrate its use on gold nanoparticles and a hafnium dioxide thin film showing its versatility in nano- and atomic-scale experiments. BEACON can correct all first- and second-order aberrations simultaneously to achieve an initial alignment and first- and second-order aberrations independently for fine alignment. Ptychographic reconstructions are used to demonstrate an improvement in probe shape and a reduction in the target aberration. |
| title | BEACON -- Automated Aberration Correction for Scanning Transmission Electron Microscopy using Bayesian Optimization |
| topic | Materials Science Instrumentation and Detectors |
| url | https://arxiv.org/abs/2410.14873 |