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BEACON -- Automated Aberration Correction for Scanning Transmission Electron Microscopy using Bayesian Optimization

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Pattison, Alexander J., Ribet, Stephanie M., Noack, Marcus M., Varnavides, Georgios, Park, Kunwoo, Kirkland, Earl, Park, Jungwon, Ophus, Colin, Ercius, Peter
Format:	Preprint
Publié:	2024
Sujets:	Materials Science Instrumentation and Detectors
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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