If LLMs Would Just Look: Simple Line-by-line Checking Improves Vulnerability Localization

Fuente: arXiv
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Bibliographic Details
Main Authors: Li, Yue, Li, Xiao, Wu, Hao, Zhang, Yue, Cheng, Xiuzhen, Liu, Yating, Xu, Fengyuan, Zhong, Sheng
Format: Preprint
Published: 2024
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