Cita APA (7a ed.)

Strand, F. S., Cooil, S. P., Campbell, Q. T., Flounders, J. J., Røst, H. I., Åsland, A. C., . . . Wells, J. W. (2024). Direct measurement of 2DEG states in shallow Si: Sb $δ$-layers.

Cita Chicago Style (17a ed.)

Strand, Frode S., et al. Direct Measurement of 2DEG States in Shallow Si: Sb $δ$-layers. 2024.

Cita MLA (9a ed.)

Strand, Frode S., et al. Direct Measurement of 2DEG States in Shallow Si: Sb $δ$-layers. 2024.