Strand, F. S., Cooil, S. P., Campbell, Q. T., Flounders, J. J., Røst, H. I., Åsland, A. C., . . . Wells, J. W. (2024). Direct measurement of 2DEG states in shallow Si: Sb $δ$-layers.
Chicago Style (17th ed.) CitationStrand, Frode S., et al. Direct Measurement of 2DEG States in Shallow Si: Sb $δ$-layers. 2024.
MLA (9th ed.) CitationStrand, Frode S., et al. Direct Measurement of 2DEG States in Shallow Si: Sb $δ$-layers. 2024.
Warning: These citations may not always be 100% accurate.