Direct measurement of 2DEG states in shallow Si:Sb $δ$-layers

Fuente: arXiv

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Bibliographic Details
Main Authors:	Strand, Frode S., Cooil, Simon P., Campbell, Quinn T., Flounders, John J., Røst, Håkon I., Åsland, Anna Cecilie, Skarpeid, Alv Johan, Stalsberg, Marte P., Hu, Jinbang, Bakkelund, Johannes, Bjelland, Victoria, Preobrajenski, Alexei B., Li, Zheshen, Bianchi, Marco, Miwa, Jill A., Wells, Justin W.
Format:	Preprint
Published:	2024
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2410.17387