Scattering near-field optical microscopy at 1-nm resolution using ultralow tip oscillation amplitudes
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arXiv
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| Autori principali: | , , , , , , |
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| Natura: | Preprint |
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2024
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| _version_ | 1866916790829842432 |
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| author | Shiotari, Akitoshi Nishida, Jun Hammud, Adnan Schulz, Fabian Wolf, Martin Kumagai, Takashi Müller, Melanie |
| author_facet | Shiotari, Akitoshi Nishida, Jun Hammud, Adnan Schulz, Fabian Wolf, Martin Kumagai, Takashi Müller, Melanie |
| contents | Scattering-type scanning near-field optical microscopy (s-SNOM) allows for the observation of the optical response of material surfaces with a resolution far below the diffraction limit. Based on amplitude-modulation atomic force microscopy (AFM) with typical tapping amplitudes of tens of nanometers, a spatial resolution of 10-100 nm is routinely achieved in s-SNOM. However, optical imaging and spectroscopy of atomic-scale structures remain a substantial challenge. Here, we developed ultralow tip oscillation amplitude s-SNOM (ULA-SNOM), where the ultra-confined field localized at a 1-nm-scale gap between a plasmonic tip and sample is combined with frequency-modulation (non-contact) AFM in a stable cryogenic ultrahigh vacuum environment. Using a silver tip under visible laser illumination with a constant 1-nm amplitude oscillation, we obtain a material-contrast image of silicon islands on a silver surface with 1-nm lateral resolution, which surpasses the conventional limits of s-SNOM. ULA-SNOM paves the way for the acquisition of optical information from atomic-scale structures, such as single photo-active defects and molecules. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2410_18455 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Scattering near-field optical microscopy at 1-nm resolution using ultralow tip oscillation amplitudes Shiotari, Akitoshi Nishida, Jun Hammud, Adnan Schulz, Fabian Wolf, Martin Kumagai, Takashi Müller, Melanie Optics Mesoscale and Nanoscale Physics Scattering-type scanning near-field optical microscopy (s-SNOM) allows for the observation of the optical response of material surfaces with a resolution far below the diffraction limit. Based on amplitude-modulation atomic force microscopy (AFM) with typical tapping amplitudes of tens of nanometers, a spatial resolution of 10-100 nm is routinely achieved in s-SNOM. However, optical imaging and spectroscopy of atomic-scale structures remain a substantial challenge. Here, we developed ultralow tip oscillation amplitude s-SNOM (ULA-SNOM), where the ultra-confined field localized at a 1-nm-scale gap between a plasmonic tip and sample is combined with frequency-modulation (non-contact) AFM in a stable cryogenic ultrahigh vacuum environment. Using a silver tip under visible laser illumination with a constant 1-nm amplitude oscillation, we obtain a material-contrast image of silicon islands on a silver surface with 1-nm lateral resolution, which surpasses the conventional limits of s-SNOM. ULA-SNOM paves the way for the acquisition of optical information from atomic-scale structures, such as single photo-active defects and molecules. |
| title | Scattering near-field optical microscopy at 1-nm resolution using ultralow tip oscillation amplitudes |
| topic | Optics Mesoscale and Nanoscale Physics |
| url | https://arxiv.org/abs/2410.18455 |