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Statistical Analysis of Spurious Dot Formation in SiMOS Single Electron Transistors

Fuente: arXiv

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Bibliographic Details
Main Authors:	Chen, Kuan-Chu, Godfrin, Clement, Simion, George, Fattal, Imri, Kubicek, Stefan, Beyne, Sofie, Raes, Bart, Loenders, Arne, Kao, Kuo-Hsing, Wan, Danny, De Greve, Kristiaan
Format:	Preprint
Published:	2024
Subjects:	Mesoscale and Nanoscale Physics
Online Access:	Acceder al recurso
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