Single-shot X-ray ptychography as a structured illumination method
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| Main Authors: | , , , , , , |
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| Format: | Preprint |
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2024
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| _version_ | 1866929667125018624 |
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| author | Levitan, Abraham Wakonig, Klaus Gao, Zirui Kubec, Adam Chen, Bing Kuan Cohen, Oren Guizar-Sicairos, Manuel |
| author_facet | Levitan, Abraham Wakonig, Klaus Gao, Zirui Kubec, Adam Chen, Bing Kuan Cohen, Oren Guizar-Sicairos, Manuel |
| contents | Single-shot ptychography is a quantitative phase imaging method wherein overlapping beams of light arranged in a grid pattern simultaneously illuminate a sample, allowing a full ptychographic dataset to be collected in a single shot. It is primarily used at optical wavelengths, but there is interest in using it for X-ray imaging. However, the constraints imposed by X-ray optics have limited the resolution achievable to date. In this work, we reinterpret single-shot ptychography as a structured illumination method by viewing the grid of beams as a single, highly structured illumination function. Pre-calibrating this illumination and reconstructing single-shot data using the randomized probe imaging algorithm allows us to account for the overlap and coherent interference between the diffraction arising from each beam. We achieve a resolution 3.5 times finer than the numerical aperture-based limit imposed by traditional algorithms for single-shot ptychography. We argue that this reconstruction method will work better for most single-shot ptychography experiments and discuss the implications for the design of future single-shot X-ray microscopes. |
| format | Preprint |
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arxiv_https___arxiv_org_abs_2410_19197 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Single-shot X-ray ptychography as a structured illumination method Levitan, Abraham Wakonig, Klaus Gao, Zirui Kubec, Adam Chen, Bing Kuan Cohen, Oren Guizar-Sicairos, Manuel Optics Image and Video Processing Applied Physics Single-shot ptychography is a quantitative phase imaging method wherein overlapping beams of light arranged in a grid pattern simultaneously illuminate a sample, allowing a full ptychographic dataset to be collected in a single shot. It is primarily used at optical wavelengths, but there is interest in using it for X-ray imaging. However, the constraints imposed by X-ray optics have limited the resolution achievable to date. In this work, we reinterpret single-shot ptychography as a structured illumination method by viewing the grid of beams as a single, highly structured illumination function. Pre-calibrating this illumination and reconstructing single-shot data using the randomized probe imaging algorithm allows us to account for the overlap and coherent interference between the diffraction arising from each beam. We achieve a resolution 3.5 times finer than the numerical aperture-based limit imposed by traditional algorithms for single-shot ptychography. We argue that this reconstruction method will work better for most single-shot ptychography experiments and discuss the implications for the design of future single-shot X-ray microscopes. |
| title | Single-shot X-ray ptychography as a structured illumination method |
| topic | Optics Image and Video Processing Applied Physics |
| url | https://arxiv.org/abs/2410.19197 |