Enhancing Apple's Defect Classification: Insights from Visible Spectrum and Narrow Spectral Band Imaging

Fuente: arXiv

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Bibliographic Details
Main Authors:	Coello, Omar, Coronel, Moisés, Carpio, Darío, Vintimilla, Boris, Chuquimarca, Luis
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Machine Learning 68T45 I.2; I.4
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2410.19784