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Scaling Effects of Transistor Leakage Current and IR Drop on 1T1R Memory Arrays

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Chen, Junren, Indiveri, Giacomo
Formato:	Preprint
Publicado:	2024
Materias:	Emerging Technologies
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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