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Long-term stability and oxidation of ferroelectric AlScN devices: An operando HAXPES study

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Rehm, Oliver, Baumgarten, Lutz, Guido, Roberto, Düring, Pia Maria, Gloskovskii, Andrei, Schlueter, Christoph, Mikolajick, Thomas, Schroeder, Uwe, Müller, Martina
Formato:	Preprint
Publicado:	2024
Materias:	Materials Science
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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