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| Main Authors: | , , , , , |
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| Format: | Preprint |
| Published: |
2024
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2410.22107 |
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| _version_ | 1866929716620951552 |
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| author | Vermeij, Tijmen Sharma, Amit Steinbach, Douglas Lou, Jun Michler, Johann Maeder, Xavier |
| author_facet | Vermeij, Tijmen Sharma, Amit Steinbach, Douglas Lou, Jun Michler, Johann Maeder, Xavier |
| contents | We present a methodology for in situ Transmission Kikuchi Diffraction (TKD) tensile testing that enables nanoscale characterization of the evolution of complex plasticity mechanisms. By integrating a modified in situ scanning electron microscope nanoindenter with a microscale push-to-pull device and a conventional Electron Backscatter Diffraction (EBSD) detector, we achieved TKD measurements at high spatial resolution during mechanical deformation. A dedicated focused ion beam procedure was developed for site-specific specimen fabrication, including lift-out, thinning, and shaping into a dog-bone geometry. The methodology was demonstrated on two case studies: (i) a metastable $β$-Ti single crystal, on which we quantified the initiation and evolution of nanoscale twinning and stress-induced martensitic transformation, and (ii) a $CuAl/Al_2O_3$ nanolaminate, which showed nanoscale plasticity and twinning/detwinning in a complex microstructure. Overall, this approach provides a robust alternative to in situ EBSD and transmission electron microscopy testing, facilitating detailed analysis of deformation mechanisms at the nanoscale. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2410_22107 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | In-situ Transmission Kikuchi Diffraction Tensile Testing Vermeij, Tijmen Sharma, Amit Steinbach, Douglas Lou, Jun Michler, Johann Maeder, Xavier Materials Science Instrumentation and Detectors We present a methodology for in situ Transmission Kikuchi Diffraction (TKD) tensile testing that enables nanoscale characterization of the evolution of complex plasticity mechanisms. By integrating a modified in situ scanning electron microscope nanoindenter with a microscale push-to-pull device and a conventional Electron Backscatter Diffraction (EBSD) detector, we achieved TKD measurements at high spatial resolution during mechanical deformation. A dedicated focused ion beam procedure was developed for site-specific specimen fabrication, including lift-out, thinning, and shaping into a dog-bone geometry. The methodology was demonstrated on two case studies: (i) a metastable $β$-Ti single crystal, on which we quantified the initiation and evolution of nanoscale twinning and stress-induced martensitic transformation, and (ii) a $CuAl/Al_2O_3$ nanolaminate, which showed nanoscale plasticity and twinning/detwinning in a complex microstructure. Overall, this approach provides a robust alternative to in situ EBSD and transmission electron microscopy testing, facilitating detailed analysis of deformation mechanisms at the nanoscale. |
| title | In-situ Transmission Kikuchi Diffraction Tensile Testing |
| topic | Materials Science Instrumentation and Detectors |
| url | https://arxiv.org/abs/2410.22107 |