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Autori principali: Shen, Qia, Chen, Jiaxin, Rong, Bin, Rong, Yaqi, Chen, Hongliang, Zhao, Tieyang, Duan, Xianfa, Guan, Dandan, Wang, Shiyong, Li, Yaoyi, Zheng, Hao, Liu, Xiaoxue, Qiu, Xuepeng, Chen, Jingsheng, Cong, Longqing, Li, Tingxin, Zhong, Ruidan, Liu, Canhua, Yang, Yumeng, Liu, Liang, Jia, Jinfeng
Natura: Preprint
Pubblicazione: 2024
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Accesso online:https://arxiv.org/abs/2410.22156
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author Shen, Qia
Chen, Jiaxin
Rong, Bin
Rong, Yaqi
Chen, Hongliang
Zhao, Tieyang
Duan, Xianfa
Guan, Dandan
Wang, Shiyong
Li, Yaoyi
Zheng, Hao
Liu, Xiaoxue
Qiu, Xuepeng
Chen, Jingsheng
Cong, Longqing
Li, Tingxin
Zhong, Ruidan
Liu, Canhua
Yang, Yumeng
Liu, Liang
Jia, Jinfeng
author_facet Shen, Qia
Chen, Jiaxin
Rong, Bin
Rong, Yaqi
Chen, Hongliang
Zhao, Tieyang
Duan, Xianfa
Guan, Dandan
Wang, Shiyong
Li, Yaoyi
Zheng, Hao
Liu, Xiaoxue
Qiu, Xuepeng
Chen, Jingsheng
Cong, Longqing
Li, Tingxin
Zhong, Ruidan
Liu, Canhua
Yang, Yumeng
Liu, Liang
Jia, Jinfeng
contents Nonlinear Hall effect (NLHE) offers a novel means of uncovering symmetry and topological properties in quantum materials, holding promise for exotic (opto)electronic applications such as microwave rectification and THz detection. The BCD-independent NLHE could exhibit a robust response even at room temperature, which is highly desirable for practical applications. However, in materials with bulk inversion symmetry, the coexistence of bulk and surface conducting channels often leads to a suppressed NLHE and complex thickness-dependent behavior. Here, we report the observation of room-temperature nonlinear transverse response in 3D topological insulator Bi2Te3 thin films, whose electrical transport properties are dominated by topological surface state (TSS). By varying the thickness of Bi2Te3 epitaxial films from 7 nm to 50 nm, we found that the nonlinear transverse response increases with thickness from 7 nm to 25 nm and remains almost constant above 25 nm. This is consistent with the thickness-dependent basic transport properties, including conductance, carrier density, and mobility, indicating a pure and robust TSS-dominated linear and nonlinear transport in thick (>25 nm) Bi2Te3 films. The weaker nonlinear transverse response in Bi2Te3 below 25 nm was attributed to Te deficiency and poorer crystallinity. By utilizing the TSS-dominated electrical second harmonic generation, we successfully achieved the microwave rectification from 0.01 to 16.6 GHz in 30 nm and bulk Bi2Te3. Our work demonstrated the room temperature nonlinear transverse response in a paradigm topological insulator, addressing the tunability of the topological second harmonic response by thickness engineering.
format Preprint
id arxiv_https___arxiv_org_abs_2410_22156
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Topological surface state dominated nonlinear transverse response and microwave rectification at room temperature
Shen, Qia
Chen, Jiaxin
Rong, Bin
Rong, Yaqi
Chen, Hongliang
Zhao, Tieyang
Duan, Xianfa
Guan, Dandan
Wang, Shiyong
Li, Yaoyi
Zheng, Hao
Liu, Xiaoxue
Qiu, Xuepeng
Chen, Jingsheng
Cong, Longqing
Li, Tingxin
Zhong, Ruidan
Liu, Canhua
Yang, Yumeng
Liu, Liang
Jia, Jinfeng
Materials Science
Nonlinear Hall effect (NLHE) offers a novel means of uncovering symmetry and topological properties in quantum materials, holding promise for exotic (opto)electronic applications such as microwave rectification and THz detection. The BCD-independent NLHE could exhibit a robust response even at room temperature, which is highly desirable for practical applications. However, in materials with bulk inversion symmetry, the coexistence of bulk and surface conducting channels often leads to a suppressed NLHE and complex thickness-dependent behavior. Here, we report the observation of room-temperature nonlinear transverse response in 3D topological insulator Bi2Te3 thin films, whose electrical transport properties are dominated by topological surface state (TSS). By varying the thickness of Bi2Te3 epitaxial films from 7 nm to 50 nm, we found that the nonlinear transverse response increases with thickness from 7 nm to 25 nm and remains almost constant above 25 nm. This is consistent with the thickness-dependent basic transport properties, including conductance, carrier density, and mobility, indicating a pure and robust TSS-dominated linear and nonlinear transport in thick (>25 nm) Bi2Te3 films. The weaker nonlinear transverse response in Bi2Te3 below 25 nm was attributed to Te deficiency and poorer crystallinity. By utilizing the TSS-dominated electrical second harmonic generation, we successfully achieved the microwave rectification from 0.01 to 16.6 GHz in 30 nm and bulk Bi2Te3. Our work demonstrated the room temperature nonlinear transverse response in a paradigm topological insulator, addressing the tunability of the topological second harmonic response by thickness engineering.
title Topological surface state dominated nonlinear transverse response and microwave rectification at room temperature
topic Materials Science
url https://arxiv.org/abs/2410.22156