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Main Authors: Zhang, Yufei, Xu, Yicheng, Wei, Hongxin, Lin, Zhiping, Zou, Xiaofeng, Chen, Cen, Zhuang, Huiping
Format: Preprint
Published: 2024
Subjects:
Online Access:https://arxiv.org/abs/2410.22373
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author Zhang, Yufei
Xu, Yicheng
Wei, Hongxin
Lin, Zhiping
Zou, Xiaofeng
Chen, Cen
Zhuang, Huiping
author_facet Zhang, Yufei
Xu, Yicheng
Wei, Hongxin
Lin, Zhiping
Zou, Xiaofeng
Chen, Cen
Zhuang, Huiping
contents Test-Time Adaptation (TTA) enables pre-trained models to bridge the gap between source and target datasets using unlabeled test data, addressing domain shifts caused by corruptions like weather changes, noise, or sensor malfunctions in test time. Multi-Modal Continual Test-Time Adaptation (MM-CTTA), as an extension of standard TTA, further allows models to handle multi-modal inputs and adapt to continuously evolving target domains. However, MM-CTTA faces critical challenges such as catastrophic forgetting and reliability bias, which are rarely addressed effectively under multi-modal corruption scenarios. In this paper, we propose a novel approach, Multi-modality Dynamic Analytic Adapter (MDAA), to tackle MM-CTTA tasks. MDAA introduces analytic learning,a closed-form training technique,through Analytic Classifiers (ACs) to mitigate catastrophic forgetting. Furthermore, we design the Dynamic Late Fusion Mechanism (DLFM) to dynamically select and integrate reliable information from different modalities. Extensive experiments show that MDAA achieves state-of-the-art performance across the proposed tasks.
format Preprint
id arxiv_https___arxiv_org_abs_2410_22373
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Analytic Continual Test-Time Adaptation for Multi-Modality Corruption
Zhang, Yufei
Xu, Yicheng
Wei, Hongxin
Lin, Zhiping
Zou, Xiaofeng
Chen, Cen
Zhuang, Huiping
Machine Learning
Artificial Intelligence
Test-Time Adaptation (TTA) enables pre-trained models to bridge the gap between source and target datasets using unlabeled test data, addressing domain shifts caused by corruptions like weather changes, noise, or sensor malfunctions in test time. Multi-Modal Continual Test-Time Adaptation (MM-CTTA), as an extension of standard TTA, further allows models to handle multi-modal inputs and adapt to continuously evolving target domains. However, MM-CTTA faces critical challenges such as catastrophic forgetting and reliability bias, which are rarely addressed effectively under multi-modal corruption scenarios. In this paper, we propose a novel approach, Multi-modality Dynamic Analytic Adapter (MDAA), to tackle MM-CTTA tasks. MDAA introduces analytic learning,a closed-form training technique,through Analytic Classifiers (ACs) to mitigate catastrophic forgetting. Furthermore, we design the Dynamic Late Fusion Mechanism (DLFM) to dynamically select and integrate reliable information from different modalities. Extensive experiments show that MDAA achieves state-of-the-art performance across the proposed tasks.
title Analytic Continual Test-Time Adaptation for Multi-Modality Corruption
topic Machine Learning
Artificial Intelligence
url https://arxiv.org/abs/2410.22373