Saved in:
| Main Authors: | , , , |
|---|---|
| Format: | Preprint |
| Published: |
2024
|
| Subjects: | |
| Online Access: | https://arxiv.org/abs/2410.22393 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Table of Contents:
- This manuscript presents a comparative analysis of two software packages, MC X-ray and PENELOPE, focusing on their accuracy and efficiency in simulating k-ratios for binary compounds and comparing their spectra with experimental data for pure elements and compounds. Based on the Pouchou database, MC X-ray slightly outperforms PENELOPE in k-ratio calculations, achieving a root mean square error (RMSE) of 2.71\% compared to 2.87\%. Discrepancies between the two programs emerge at lower beam energies (3 keV and 5 keV) when comparing simulated spectra with experimental data; however, at higher energies (20 keV and 30 keV), both software packages exhibit consistent and reliable performance across a range of atomic numbers. While both tools are effective for analyzing homogeneous bulk samples, MC X-ray offers significant advantages in processing speed and user-friendliness. This study underscores the strengths and limitations of each package, providing valuable insights for researchers engaged in X-ray simulation and microanalysis.