Kim, Y., Kim, J., & Lee, S. (2024). CleaR: Towards Robust and Generalized Parameter-Efficient Fine-Tuning for Noisy Label Learning.
Cita Chicago Style (17a ed.)Kim, Yeachan, Junho Kim, y SangKeun Lee. CleaR: Towards Robust and Generalized Parameter-Efficient Fine-Tuning for Noisy Label Learning. 2024.
Cita MLA (9a ed.)Kim, Yeachan, et al. CleaR: Towards Robust and Generalized Parameter-Efficient Fine-Tuning for Noisy Label Learning. 2024.
Precaución: Estas citas no son 100% exactas.