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High-space-bandwidth product characterization of metalenses with Fourier ptychographic microscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Zheng, Chuanjian, Wang, Wenli, Ji, Yanfang, Hu, Yao, Zhang, Shaohui, Hao, Qun
Format:	Preprint
Published:	2024
Subjects:	Optics
Online Access:	Acceder al recurso
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