Dependence of Electrostatic Patch Force Evaluation on the Lateral Resolution of Kelvin Probe Force Microscopy

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Shi, Kun, Luo, Pengshun, Liu, Jinquan, Yin, Hang, Zhou, Zebing
Format: Preprint
Published: 2024
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!