Global Alignment Reference Strategy for Laser Interference Lithography Pattern Arrays

Fuente: arXiv
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Autori principali: Gao, Xiang, Li, Jingwen, Zhong, Zijian, Li, Xinghui
Natura: Preprint
Pubblicazione: 2024
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author Gao, Xiang
Li, Jingwen
Zhong, Zijian
Li, Xinghui
author_facet Gao, Xiang
Li, Jingwen
Zhong, Zijian
Li, Xinghui
contents Large-area gratings play a crucial role in various engineering fields. However, traditional interference lithography is limited by the size of optical component apertures, making large-area fabrication a challenging task. Here, a method for fabricating laser interference lithography pattern arrays with a global alignment reference strategy is proposed. This approach enables alignment of each area of the laser interference lithography pattern arrays, including phase, period, and tilt angle. Two reference gratings are utilized: one is detached from the substrate, while the other remains fixed to it. To achieve global alignment, the exposure area is adjusted by alternating between moving the beam and the substrate. In our experiment, a 3 $\times$ 3 regions grating array was fabricated, and the $-1$st-order diffraction wavefront measured by the Fizeau interferometer exhibited good continuity. This technique enables effective and efficient alignment with high accuracy across any regions in an interference lithography pattern array on large substrates.
format Preprint
id arxiv_https___arxiv_org_abs_2411_01976
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Global Alignment Reference Strategy for Laser Interference Lithography Pattern Arrays
Gao, Xiang
Li, Jingwen
Zhong, Zijian
Li, Xinghui
Optics
Large-area gratings play a crucial role in various engineering fields. However, traditional interference lithography is limited by the size of optical component apertures, making large-area fabrication a challenging task. Here, a method for fabricating laser interference lithography pattern arrays with a global alignment reference strategy is proposed. This approach enables alignment of each area of the laser interference lithography pattern arrays, including phase, period, and tilt angle. Two reference gratings are utilized: one is detached from the substrate, while the other remains fixed to it. To achieve global alignment, the exposure area is adjusted by alternating between moving the beam and the substrate. In our experiment, a 3 $\times$ 3 regions grating array was fabricated, and the $-1$st-order diffraction wavefront measured by the Fizeau interferometer exhibited good continuity. This technique enables effective and efficient alignment with high accuracy across any regions in an interference lithography pattern array on large substrates.
title Global Alignment Reference Strategy for Laser Interference Lithography Pattern Arrays
topic Optics
url https://arxiv.org/abs/2411.01976