Label Critic: Design Data Before Models

Fuente: arXiv

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Bibliographic Details
Main Authors:	Bassi, Pedro R. A. S., Wu, Qilong, Li, Wenxuan, Decherchi, Sergio, Cavalli, Andrea, Yuille, Alan, Zhou, Zongwei
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2411.02753