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Reflection-mode diffraction tomography of multiple-scattering samples on a reflective substrate from intensity images

Fuente: arXiv

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Bibliographic Details
Main Authors:	Li, Tongyu, Zhu, Jiabei, Shen, Yi, Tian, Lei
Format:	Preprint
Published:	2024
Subjects:	Optics
Online Access:	Acceder al recurso
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