High-throughput Screening of Ferrimagnetic Semiconductors With Ultrahigh N$\acute{e}$el Temperature

Fuente: arXiv
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Bibliographic Details
Main Authors: Wang, Haidi, Feng, Qingqing, Li, Shuo, Lin, Wei, Zhu, Weiduo, Chen, Zhao, Li, Zhongjun, Liu, Xiaofeng, Li, Xingxing
Format: Preprint
Published: 2024
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