Si/SiO$_\text{2}$ MOSFET Reliability Physics: From Four-State Model to All-State Model

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Guo, Xinjing, Huang, Menglin, Chen, Shiyou
Format: Preprint
Published: 2024
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!