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Si/SiO$_\text{2}$ MOSFET Reliability Physics: From Four-State Model to All-State Model

Fuente: arXiv

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Détails bibliographiques
Auteurs principaux:	Guo, Xinjing, Huang, Menglin, Chen, Shiyou
Format:	Preprint
Publié:	2024
Sujets:	Materials Science Applied Physics
Accès en ligne:	Acceder al recurso
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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