Field-Induced Criticality in YbCu4Au

Fuente: arXiv

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Bibliographic Details
Main Authors:	Taniguchi, T., Osato, K., Okabe, H., Kitazawa, T., Kawamata, M., Hashimoto, S., Ikeda, Y., Nambu, Y., Sari, D. P., Watanabe, I., Nakamura, J. G., Koda, A., Gouchi, J., Uwatoko, Y., Kittaka, S., Sakakibara, T., Mizumaki, M., Kawamura, N., Yamanaka, T., Hiraki, K., Sasaki, T., Fujita, M.
Format:	Preprint
Published:	2024
Subjects:	Strongly Correlated Electrons
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2411.05280