Metrology and Manufacturing-Integrated Digital Twin (MM-DT) for Advanced Manufacturing: Insights from CMM and FARO Arm Measurements

Fuente: arXiv
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Autores principales: Samadi, Hamidreza, Ahsan, Md Manjurul, Raman, Shivakumar
Formato: Preprint
Publicado: 2024
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author Samadi, Hamidreza
Ahsan, Md Manjurul
Raman, Shivakumar
author_facet Samadi, Hamidreza
Ahsan, Md Manjurul
Raman, Shivakumar
contents Metrology, the science of measurement, plays a key role in Advanced Manufacturing (AM) to ensure quality control, process optimization, and predictive maintenance. However, it has often been overlooked in AM domains due to the current focus on automation and the complexity of integrated precise measurement systems. Over the years, Digital Twin (DT) technology in AM has gained much attention due to its potential to address these challenges through physical data integration and real-time monitoring, though its use in metrology remains limited. Taking this into account, this study proposes a novel framework, the Metrology and Manufacturing-Integrated Digital Twin (MM-DT), which focuses on data from two metrology tools, collected from Coordinate Measuring Machines (CMM) and FARO Arm devices. Throughout this process, we measured 20 manufacturing parts, with each part assessed twice under different temperature conditions. Using Ensemble Machine Learning methods, our proposed approach predicts measurement deviations accurately, achieving an R2 score of 0.91 and reducing the Root Mean Square Error (RMSE) to 1.59 micrometers. Our MM-DT framework demonstrates its efficiency by improving metrology processes and offers valuable insights for researchers and practitioners who aim to increase manufacturing precision and quality.
format Preprint
id arxiv_https___arxiv_org_abs_2411_05286
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Metrology and Manufacturing-Integrated Digital Twin (MM-DT) for Advanced Manufacturing: Insights from CMM and FARO Arm Measurements
Samadi, Hamidreza
Ahsan, Md Manjurul
Raman, Shivakumar
Computational Engineering, Finance, and Science
Metrology, the science of measurement, plays a key role in Advanced Manufacturing (AM) to ensure quality control, process optimization, and predictive maintenance. However, it has often been overlooked in AM domains due to the current focus on automation and the complexity of integrated precise measurement systems. Over the years, Digital Twin (DT) technology in AM has gained much attention due to its potential to address these challenges through physical data integration and real-time monitoring, though its use in metrology remains limited. Taking this into account, this study proposes a novel framework, the Metrology and Manufacturing-Integrated Digital Twin (MM-DT), which focuses on data from two metrology tools, collected from Coordinate Measuring Machines (CMM) and FARO Arm devices. Throughout this process, we measured 20 manufacturing parts, with each part assessed twice under different temperature conditions. Using Ensemble Machine Learning methods, our proposed approach predicts measurement deviations accurately, achieving an R2 score of 0.91 and reducing the Root Mean Square Error (RMSE) to 1.59 micrometers. Our MM-DT framework demonstrates its efficiency by improving metrology processes and offers valuable insights for researchers and practitioners who aim to increase manufacturing precision and quality.
title Metrology and Manufacturing-Integrated Digital Twin (MM-DT) for Advanced Manufacturing: Insights from CMM and FARO Arm Measurements
topic Computational Engineering, Finance, and Science
url https://arxiv.org/abs/2411.05286