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| Main Author: | |
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| Format: | Preprint |
| Published: |
2024
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2411.05944 |
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Table of Contents:
- This chapter introduces the use of X-ray absorption spectroscopy (XAS) in studying the local electronic and atomic structure of high-entropy materials. The element selectivity of XAS makes it particularly suitable to address the challenges posed by the study of multicomponent compounds. By analysing different parts of the X-ray absorption spectra for each element, one can obtain information on its chemical state from the X-ray absorption near-edge structure (XANES) and its local environment, distortions, and lattice dynamics from the extended X-ray absorption fine structure (EXAFS). The theoretical background underlying X-ray absorption spectra and existing data analysis procedures are briefly described, with particular emphasis on advanced atomistic modelling techniques that enable more reliable extraction of structural information. Finally, an overview of the applications of the XAS technique in studying high-entropy materials is presented.