Corner cutting connects chiral colorimetry to net electric flux in lossless all-dielectric metasurfaces

Fuente: arXiv
Saved in:
Bibliographic Details
Main Authors: Haddadin, Zaid, Nguyen, Anna My, Poulikakos, Lisa V.
Format: Preprint
Published: 2024
Subjects:
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1866913975244947456
author Haddadin, Zaid
Nguyen, Anna My
Poulikakos, Lisa V.
author_facet Haddadin, Zaid
Nguyen, Anna My
Poulikakos, Lisa V.
contents All-dielectric metasurfaces can produce structural colors, but the most advantageous design criteria are still being investigated. This work numerically studies how the two-dimensional shape of nanoparticles affects the colorimetric response under circularly polarized light (CPL) to develop a sensor distinguishing CPL orientations. Using lossless dielectric materials (silicon nitride on silicon dioxide), we achieve far-field dichroism by modifying oblong nanoparticles into L-shaped structures through corner cuts. This design suppresses one electric dipole under CPL illumination, leading to differential colorimetric responses. We link these responses to a decoupling effect in the near-field net electric flux. Our findings provide design guidelines for all-dielectric, lossless colorimetric sensors of chiral light.
format Preprint
id arxiv_https___arxiv_org_abs_2411_05984
institution arXiv
publishDate 2024
record_format arxiv
spellingShingle Corner cutting connects chiral colorimetry to net electric flux in lossless all-dielectric metasurfaces
Haddadin, Zaid
Nguyen, Anna My
Poulikakos, Lisa V.
Optics
Applied Physics
All-dielectric metasurfaces can produce structural colors, but the most advantageous design criteria are still being investigated. This work numerically studies how the two-dimensional shape of nanoparticles affects the colorimetric response under circularly polarized light (CPL) to develop a sensor distinguishing CPL orientations. Using lossless dielectric materials (silicon nitride on silicon dioxide), we achieve far-field dichroism by modifying oblong nanoparticles into L-shaped structures through corner cuts. This design suppresses one electric dipole under CPL illumination, leading to differential colorimetric responses. We link these responses to a decoupling effect in the near-field net electric flux. Our findings provide design guidelines for all-dielectric, lossless colorimetric sensors of chiral light.
title Corner cutting connects chiral colorimetry to net electric flux in lossless all-dielectric metasurfaces
topic Optics
Applied Physics
url https://arxiv.org/abs/2411.05984