Modeling Extensive Defects in Metals through Classical Potential-Guided Sampling and Automated Configuration Reconstruction

Fuente: arXiv

Saved in:

Bibliographic Details
Main Authors:	Shuang, Fei, Liu, Kai, Ji, Yucheng, Gao, Wei, Laurenti, Luca, Dey, Poulumi
Format:	Preprint
Published:	2024
Subjects:	Materials Science
Online Access:	Acceder al recurso
Tags:	Add Tag No Tags, Be the first to tag this record!

Internet

https://arxiv.org/abs/2411.07367