Electron dynamics and SiO2 etching profile evolution in capacitive Ar/CHF3 discharges driven by sawtooth-tailored voltage waveforms

Fuente: arXiv
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Main Authors: Dong, Wan, Song, Liu-Qin, Zhang, Yi-Fan, Wang, Li, Song, Yuan-Hong, Schulze, Julian
Format: Preprint
Published: 2024
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