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  • Characterisation of analogue MAPS produced in the 65 nm TPSCo process
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Characterisation of analogue MAPS produced in the 65 nm TPSCo process

Fuente: arXiv
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Bibliographic Details
Main Authors: Ploerer, Eduardo, Baba, Hitoshi, Baudot, Jerome, Besson, Auguste, Bugiel, Szymon, Chujo, Tatsuya, Colledani, Claude, Dorokhov, Andrei, Bitar, Ziad El, Goffe, Mathieu, Gunji, Taku, Hu-Guo, Christine, Ilg, Armin, Jaaskelainen, Kimmo, Katsuno, Towa, Kluge, Alexander, Kostina, Anhelina, Kumar, Ajit, Lorenzetti, Alessandra, Macchiolo, Anna, Mager, Magnus, Park, Jonghan, Sakai, Shingo, Senyukov, Serhiy, Shamas, Hasan, Shibata, Daito, Snoeys, Walter, Stanek, Pavel, Suljic, Miljenko, Tomasek, Lukas, Valin, Isabelle, Wada, Reita, Yamaguchi, Yorito, Collaboration, the ALICE
Format: Preprint
Published: 2024
Subjects:
Instrumentation and Detectors
High Energy Physics - Experiment
Online Access:
Acceder al recurso
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Internet

https://arxiv.org/abs/2411.08740

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