Confidence-aware Denoised Fine-tuning of Off-the-shelf Models for Certified Robustness

Fuente: arXiv

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Bibliographic Details
Main Authors:	Jang, Suhyeok, Kim, Seojin, Shin, Jinwoo, Jeong, Jongheon
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence Cryptography and Security Machine Learning
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2411.08933