A Self-Supervised Robotic System for Autonomous Contact-Based Spatial Mapping of Semiconductor Properties

Documenti analoghi

• Using Scalable Computer Vision to Automate High-throughput Semiconductor Characterization
  di: Siemenn, Alexander E., et al.
  Pubblicazione: (2023)
• Multimodal transformers with elemental priors for phase classification of X-ray diffraction spectra
  di: Ji, Kangyu, et al.
  Pubblicazione: (2025)
• Closed-Loop Robotic Manipulation of Transparent Substrates for Self-Driving Laboratories using Deep Learning Micro-Error Correction
  di: Fontenot, Kelsey, et al.
  Pubblicazione: (2025)
• A closed-loop AI framework for hypothesis-driven and interpretable materials design
  di: Ji, Kangyu, et al.
  Pubblicazione: (2025)
• A tomographic interpretation of structure-property relations for materials discovery
  di: Ortega-Ochoa, Raul, et al.
  Pubblicazione: (2025)