APA (7th ed.) Citation

Yu, J., Zhou, Y., Wang, X., Ma, X., Dodabalapur, A., & Lai, K. (2024). Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy.

Chicago Style (17th ed.) Citation

Yu, Jia, Yuchen Zhou, Xiao Wang, Xuejian Ma, Ananth Dodabalapur, and Keji Lai. Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy. 2024.

MLA (9th ed.) Citation

Yu, Jia, et al. Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy. 2024.