Yu, J., Zhou, Y., Wang, X., Ma, X., Dodabalapur, A., & Lai, K. (2024). Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy.
Cita Chicago Style (17a ed.)Yu, Jia, Yuchen Zhou, Xiao Wang, Xuejian Ma, Ananth Dodabalapur, y Keji Lai. Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy. 2024.
Cita MLA (9a ed.)Yu, Jia, et al. Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy. 2024.
Precaución: Estas citas no son 100% exactas.