Cita APA (7a ed.)

Yu, J., Zhou, Y., Wang, X., Ma, X., Dodabalapur, A., & Lai, K. (2024). Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy.

Cita Chicago Style (17a ed.)

Yu, Jia, Yuchen Zhou, Xiao Wang, Xuejian Ma, Ananth Dodabalapur, y Keji Lai. Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy. 2024.

Cita MLA (9a ed.)

Yu, Jia, et al. Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy. 2024.

Precaución: Estas citas no son 100% exactas.