Yu, J., Zhou, Y., Wang, X., Ma, X., Dodabalapur, A., & Lai, K. (2024). Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy.
Chicago-Zitierstil (17. Ausg.)Yu, Jia, Yuchen Zhou, Xiao Wang, Xuejian Ma, Ananth Dodabalapur, und Keji Lai. Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy. 2024.
MLA-Zitierstil (9. Ausg.)Yu, Jia, et al. Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy. 2024.
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