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Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy

Fuente: arXiv

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Bibliographic Details
Main Authors:	Yu, Jia, Zhou, Yuchen, Wang, Xiao, Ma, Xuejian, Dodabalapur, Ananth, Lai, Keji
Format:	Preprint
Published:	2024
Subjects:	Materials Science
Online Access:	Acceder al recurso
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