Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network

Fuente: arXiv

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Bibliographic Details
Main Authors:	Bao, Yin-Yin, Li, Er-Chao, Yang, Hong-Qiang, Jia, Bin-Bin
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition Artificial Intelligence Image and Video Processing 68T07, 68U10 I.2.10; I.5.1; I.5.4; I.4.8
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2411.11029