Stacking Brick by Brick: Aligned Feature Isolation for Incremental Face Forgery Detection

Fuente: arXiv

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Bibliographic Details
Main Authors:	Cheng, Jikang, Yan, Zhiyuan, Zhang, Ying, Hao, Li, Ai, Jiaxin, Zou, Qin, Li, Chen, Wang, Zhongyuan
Format:	Preprint
Published:	2024
Subjects:	Computer Vision and Pattern Recognition
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2411.11396