MORE-Stress: Model Order Reduction based Efficient Numerical Algorithm for Thermal Stress Simulation of TSV Arrays in 2.5D/3D IC

Fuente: arXiv
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Bibliographic Details
Main Authors: Zhu, Tianxiang, Wang, Qipan, Lin, Yibo, Wang, Runsheng, Huang, Ru
Format: Preprint
Published: 2024
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