Evaluation of Analytical Models in Scattering Scanning Near-field Optical Microscopy for High Spatial Resolution Spectroscopy
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arXiv
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| Main Authors: | , , , |
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| Format: | Preprint |
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2024
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| _version_ | 1866916488510701568 |
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| author | Khajavi, Soheil Eghrari, Ali Shaterzadeh-Yazdi, Zahra Neshat, Mohammad |
| author_facet | Khajavi, Soheil Eghrari, Ali Shaterzadeh-Yazdi, Zahra Neshat, Mohammad |
| contents | Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This paper studies two analytical models for the s-SNOM probe using atomic force microscopy (AFM) tip and its interaction with a dielectric material. We evaluate the validity of these models by retrieving the permittivity spectrum of a sample material through an inverse method. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2411_12823 |
| institution | arXiv |
| publishDate | 2024 |
| record_format | arxiv |
| spellingShingle | Evaluation of Analytical Models in Scattering Scanning Near-field Optical Microscopy for High Spatial Resolution Spectroscopy Khajavi, Soheil Eghrari, Ali Shaterzadeh-Yazdi, Zahra Neshat, Mohammad Optics Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This paper studies two analytical models for the s-SNOM probe using atomic force microscopy (AFM) tip and its interaction with a dielectric material. We evaluate the validity of these models by retrieving the permittivity spectrum of a sample material through an inverse method. |
| title | Evaluation of Analytical Models in Scattering Scanning Near-field Optical Microscopy for High Spatial Resolution Spectroscopy |
| topic | Optics |
| url | https://arxiv.org/abs/2411.12823 |