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| Main Authors: | , , , |
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| Format: | Preprint |
| Published: |
2024
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| Subjects: | |
| Online Access: | https://arxiv.org/abs/2411.12823 |
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Table of Contents:
- Scattering scanning near-field optical microscopy (s-SNOM) is a technique to enhance the spatial resolution, and when combined by Fourier transform spectroscopy it can provide spectroscopic information with high spatial resolution. This paper studies two analytical models for the s-SNOM probe using atomic force microscopy (AFM) tip and its interaction with a dielectric material. We evaluate the validity of these models by retrieving the permittivity spectrum of a sample material through an inverse method.