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Angle measurement method of electronic speckle interferometry based on Michelson interferometer

Fuente: arXiv

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Detalles Bibliográficos
Autores principales:	Siyuan, Zhu, Tao, Li, Zhongshan, Chen, Xin, Li
Formato:	Preprint
Publicado:	2024
Materias:	Applied Physics Instrumentation and Detectors
Acceso en línea:	Acceder al recurso
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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